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Journal of Microscopy|October 25, 2006
Effects of surface relaxation on convergent-beam electron diffraction analysis of stress in siliconA Benedetti, H Bender, A Lauwers, et al.Journal of Microscopy|October 25, 2006
Pecularities of nanocrystal formation in rapidly quenched (FeCo)MoCuB amorphous alloysD M Kepaptsoglou, M Paluga, M Deanko, et al.Journal of Microscopy|October 25, 2006
Scanning electron microscopy and transmission electron microscopy study of hot-deformed gamma-TiAl-based alloy microstructureJ Chrapoński, K RodakJournal of Microscopy|November 15, 2006
Microstructural analysis of iron aluminide formed by self-propagating high-temperature synthesis mechanism in aluminium matrix compositeAnita Olszówka-Myalska, Wojciech MaziarzJournal of Microscopy|November 15, 2006
Microstructural changes of CM186LC single-crystal superalloy during creep deformation at 750 degrees CB Dubiel, A Czyrska-FilemonowiczJournal of Microscopy|November 15, 2006
Influence of the processing route on microstructure and mechanical properties of the polycrystalline NiAlS Dymek, Z Witczak, M DollarJournal of Microscopy|November 15, 2006
Transmission electron microscopy study of crystallization in Fe-Si-B-Cr-C amorphous alloyT Kozieł, A Zielińska-Lipiec, Z Kedzierski, et al.Journal of Microscopy|November 15, 2006
Transmission electron microscopy characterization of the erbium silicide formation process using a Pt/Er stack on a silicon-on-insulator substrateA Łaszcz, J Katcki, J Ratajczak, et al.Journal of Microscopy|November 15, 2006
Wavelength- and energy-dispersive Electron Probe Microanalysis (EPMA) measurements with non-perpendicular incidence of the electron beamG F Bastin, P J T L Oberndorff, H J M Heijligers, et al.Journal of Microscopy|November 15, 2006
Structural analysis and intergranular corrosion tests of AISI 316L steelZ Stonawská, M Svoboda, M Sozańska, et al.Pageof 483