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Journal of Research of the National Institute of Standards and Technology|July 2, 2016
Development of A High Throughput Method Incorporating Traditional Analytical DevicesC C White, E Embree, W E Byrd, et al.Journal of Research of the National Institute of Standards and Technology|July 2, 2016
Preparation and Comprehensive Characterization of a Calcium Hydroxyapatite Reference MaterialMilenko Markovic, Bruce O Fowler, Ming S TungJournal of Research of the National Institute of Standards and Technology|November 25, 2015
Are Bragg Peaks Gaussian?Boualem HammoudaJournal of Research of the National Institute of Standards and Technology|November 25, 2015
Optical Passive Sensor Calibration for Satellite Remote Sensing and the Legacy of NOAA and NIST CooperationRaju Datla, Michael Weinreb, Joseph Rice, et al.Journal of Research of the National Institute of Standards and Technology|November 25, 2015
Translating Radiometric Requirements for Satellite Sensors to Match International StandardsAaron Pearlman, Raju Datla, Raghu Kacker, et al.Journal of Research of the National Institute of Standards and Technology|November 25, 2015
Retrospective Analysis of NIST Standard Reference Material 1450, Fibrous Glass Board, for Thermal Insulation MeasurementsRobert R Zarr, N Alan Heckert, Stefan D LeighJournal of Research of the National Institute of Standards and Technology|November 25, 2015
A Review of NIST Primary Activity Standards for (18)F: 1982 to 2013Denis E Bergeron, Jeffrey T Cessna, Bert M Coursey, et al.Journal of Research of the National Institute of Standards and Technology|November 25, 2015
Sustainability Characterization for Additive ManufacturingMahesh Mani, Kevin W Lyons, S K GuptaJournal of Research of the National Institute of Standards and Technology|November 25, 2015
The Use of Index-Matched Beads in Optical Particle CountersZhishang Hu, Dean C RippleJournal of Research of the National Institute of Standards and Technology|November 21, 2017
On the Applications of Discontinuous Bessel Integrals to ChronoamperometryWilliam T Yap, Richard A DurstPageof 111