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Journal of Research of the National Institute of Standards and Technology|January 1, 1996
Why a Condensate Can Be Thought of as Having a Definite PhaseS M Barnett, K Burnett, J A VaccaroJournal of Research of the National Institute of Standards and Technology|January 1, 1996
Evidence That Voltage Rather Than Resistance is Quantized in Breakdown of the Quantum Hall EffectM E CageJournal of Research of the National Institute of Standards and Technology|January 1, 1997
DNA Molecules as Standard Reference Materials I: Development of DNA Identification Sequences and Human Mitochondrial DNA Reference SequencesKeith McKenney, Joel Hoskins, Jingxiang Tian, et al.Journal of Research of the National Institute of Standards and Technology|January 1, 1997
Extension of the NIST AC-DC Difference Calibration Service for Current to 100 kHzJoseph R Kinard, Thomas E Lipe, Clifton B ChildersJournal of Research of the National Institute of Standards and Technology|January 1, 1997
Configurational Entropy Approach to the Kinetics of GlassesEdmund A Di Marzio, Arthur J M YangJournal of Research of the National Institute of Standards and Technology|January 1, 1997
Entropy Theory and Glass Transition: A Test by Monte Carlo SimulationJ Baschnagel, M Wolfgardt, W Paul, et al.Journal of Research of the National Institute of Standards and Technology|January 1, 1997
Conformational Entropy Contributions to the Glass Temperature of Blends of Miscible PolymersHans Adam SchneiderJournal of Research of the National Institute of Standards and Technology|January 1, 1997
Developments for a New Spectral Irradiance Scale at the National Institute of Standards and TechnologyBenjamin K TsaiJournal of Research of the National Institute of Standards and Technology|January 1, 1997
A Distribution-Independent Bound on the Level of Confidence in the Result of a MeasurementW Tyler EstlerJournal of Research of the National Institute of Standards and Technology|January 1, 1997
The 1994 North American Interagency Intercomparison of Ultraviolet Monitoring SpectroradiometersAmbler Thompson, Edward A Early, John DeLuisi, et al.Pageof 111