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Journal of Research of the National Institute of Standards and Technology|January 1, 1996
Data Import and Validation in the Inorganic Crystal Structure DatabaseH BehrensJournal of Research of the National Institute of Standards and Technology|December 24, 2016
The 1996 North American Interagency Intercomparison of Ultraviolet Monitoring SpectroradiometersEdward Early, Ambler Thompson, Carol Johnson, et al.Journal of Research of the National Institute of Standards and Technology|December 24, 2016
Uncertainty Analysis for Angle Calibrations Using Circle ClosureW Tyler EstlerJournal of Research of the National Institute of Standards and Technology|December 24, 2016
Calculating the Effects of Longitudinal Resistance in Multi-Series-Connected Quantum Hall Effect DevicesM E Cage, A Jeffery, R E Elmquist, et al.Journal of Research of the National Institute of Standards and Technology|December 24, 2016
Accurate Ab Initio Calculation of Molecular ConstantsS Kotochigova, I TupitsynJournal of Research of the National Institute of Standards and Technology|December 24, 2016
Algorithms for Fresnel Diffraction at Rectangular and Circular AperturesKlaus D MielenzJournal of Research of the National Institute of Standards and Technology|December 24, 2016
Image Evaluation of the High Resolution VUV Spectrometer at SURF II by Ray TracingN C Das, R P Madden, H M SeyoumJournal of Research of the National Institute of Standards and Technology|January 6, 2017
Scattering Parameters Representing Imperfections in Precision Coaxial Air LinesDonald R HoltJournal of Research of the National Institute of Standards and Technology|January 6, 2017
Calibration of Voltage Transformers and High- Voltage Capacitors at NISTWilliam E AndersonJournal of Research of the National Institute of Standards and Technology|January 6, 2017
The NIST Automated Computer Time ServiceJ Levine, M Weiss, D D Davis, et al.Pageof 111