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Journal of Research of the National Institute of Standards and Technology|July 5, 2023
Techniques Used to Determine Extreme Wave Heights from the NESS Data SetMarc A Maes, George Z GuJournal of Research of the National Institute of Standards and Technology|September 25, 2015
Kiloampere, Variable-Temperature, Critical-Current Measurements of High-Field SuperconductorsL F Goodrich, N Cheggour, T C Stauffer, et al.Journal of Research of the National Institute of Standards and Technology|September 25, 2015
Precise Measurement of Lunar Spectral Irradiance at Visible WavelengthsC E Cramer, K R Lykke, J T Woodward, et al.Journal of Research of the National Institute of Standards and Technology|April 26, 2016
20 °C-A Short History of the Standard Reference Temperature for Industrial Dimensional MeasurementsTed DoironJournal of Research of the National Institute of Standards and Technology|April 26, 2016
(4)He Thermophysical Properties: New Ab Initio CalculationsJohn J Hurly, James B MehlJournal of Research of the National Institute of Standards and Technology|April 26, 2016
Effect of Power Line Interference on Microphone Calibration Measurements Made at or Near Harmonics of the Power Line FrequencyRandall P Wagner, Victor NedzelnitskyJournal of Research of the National Institute of Standards and Technology|April 26, 2016
Comparison of Calibration Methods for Tristimulus ColorimetersJames L GardnerJournal of Research of the National Institute of Standards and Technology|April 26, 2016
Flow Control Through the Use of TopographyD L Cotrell, A J KearsleyJournal of Research of the National Institute of Standards and Technology|April 26, 2016
Microwave Power Absorption in Low-Reflectance, Complex, Lossy Transmission LinesJon Geist, Jayna J Shah, Mulpuri V Rao, et al.Journal of Research of the National Institute of Standards and Technology|April 26, 2016
Electro-Physical Technique for Post-Fabrication Measurements of CMOS Process Layer ThicknessesJanet C Marshall, P Thomas VernierPageof 111