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Light, Science & Applications|February 24, 2022
Deep learning in optical metrology: a reviewChao Zuo, Jiaming Qian, Shijie Feng, et al.
Light, Science & Applications|February 8, 2022
Microsphere-assisted, nanospot, non-destructive metrology for semiconductor devicesSoonyang Kwon, Jangryul Park, Kwangrak Kim, et al.
Light, Science & Applications|February 15, 2022
Computer-free computational imaging: optical computing for seeing through random mediaYunzhe Li, Lei Tian
Light, Science & Applications|April 20, 2022
Metasurface-Based Imagers Enabled Arbitrary Optical Convolution ProcessingMinsu Park, Yeonsang Park
Light, Science & Applications|July 13, 2022
Rising complexity of the OAM beam structure as a way to a higher data capacityAndrey Pryamikov
Light, Science & Applications|April 28, 2022
Single photon emission and recombination dynamics in self-assembled GaN/AlN quantum dotsJohann Stachurski, Sebastian Tamariz, Gordon Callsen, et al.
Light, Science & Applications|April 28, 2022
Ultrashort pulse laser ablation in liquids: probing the first nanoseconds of underwater phase explosionChaobo Chen, Leonid V Zhigilei
Light, Science & Applications|March 1, 2022
Seeing is believingSergey Krasikov, Yuri Kivshar
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