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Micron (Oxford, England : 1993)|February 16, 2017
Effect of accelerating voltage on beam damage of asbestos fibers in the transmission electron microscope (TEM)Joannie Martin, Martin Beauparlant, Sébastien Sauvé, et al.
Micron (Oxford, England : 1993)|November 14, 2017
Reconstruction of atomic force microscopy image using compressed sensingGuoqiang Han, Bo Lin, Yuling Lin
Micron (Oxford, England : 1993)|November 26, 2018
Single-shot real-time sub-nanosecond electron imaging aided by compressed sensing: Analytical modeling and simulationXianglei Liu, Shian Zhang, Aycan Yurtsever, et al.
Micron (Oxford, England : 1993)|November 16, 2020
An optimized TEM specimen preparation method of quantum nanostructuresHongguang Wang, Vesna Srot, Bernhard Fenk, et al.
Micron (Oxford, England : 1993)|February 2, 2019
Comparison of manual and automated image analysis techniques for characterization of fission gas pores in irradiated U-Mo fuelsCharlyne A Smith, Dennis D Keiser, Brandon D Miller, et al.
Micron (Oxford, England : 1993)|March 14, 2022
3D nanoscale elemental mapping of precipitates in steel: Evaluation of analytical electron tomography and comparison to atom probe tomographyCornelia Trummer, Francisca Mendez-Martin, Gerald Kothleitner, et al.
Micron (Oxford, England : 1993)|March 29, 2026
A comprehensive TEM study on the structure and interfacial characteristics of S' and S phases in aluminum alloysVu Ngoc Hai, Abrar Ahmed, Seungwon Lee, et al.
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