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Microscopy (Oxford, England)|October 7, 2025
Impact of Atomic Thermal Motion on the Ti L2,3-edge Fine StructureMitsutaka Haruta, I-Ching Lin, Takashi Nemoto, et al.
Microscopy (Oxford, England)|June 24, 2020
Magnetic flux density measurements from narrow grain boundaries produced in sintered permanent magnetsYoungji Cho, Sujin Lee, Yasukazu Murakami
Microscopy (Oxford, England)|August 21, 2021
Morphological components detection for super-depth-of-field bio-micrograph based on deep learningXiaohui Du, Xiangzhou Wang, Fan Xu, et al.
Microscopy (Oxford, England)|June 29, 2025
Reduction of Membrane-derived Noise Using Beam-tilt Measurement and Deep Learning in Observation using Environmental CellFumiaki Ichihashi, Yoshio Takahashi, Toshiaki Tanigaki
Microscopy (Oxford, England)|December 19, 2025
Development of a Wire Corrector for Low Accelerating Voltage Scanning Electron MicroscopyTomonori Nakano, Yu Yamazawa
Microscopy (Oxford, England)|December 2, 2025
Radiation-induced short-range order in ceramicsManabu Ishimaru
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