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Microscopy (Oxford, England)|January 18, 2024
Removal of phase residues in electron holographyYoshio Takahashi, Tetsuya Akashi, Toshiaki Tanigaki
Microscopy (Oxford, England)|December 29, 2023
Magnetic field observation in a magnetic tunnel junction by scanning transmission electron microscopyYuji Kohno, Takehito Seki, Shun Tsuruoka, et al.
Microscopy (Oxford, England)|November 6, 2023
Three-dimensional analysis of the intracellular architecture by scanning electron microscopyDaisuke Koga, Satoshi Kusumi, Hirokazu Yagi, et al.
Microscopy (Oxford, England)|February 5, 2019
Live cell imaging of dynamic behaviors of motile cilia and primary ciliumFaryal Ijaz, Koji Ikegami
Microscopy (Oxford, England)|January 17, 2020
Application of focused ion-beam sampling for sidewall-roughness measurement of free-standing sub-μm objects by atomic force microscopyTakaharu Nagatomi, Tatsuya Nakao, Yoko Fujimoto
Microscopy (Oxford, England)|October 13, 2020
Improving the depth resolution of STEM-ADF sectioning by 3D deconvolutionA Ishizuka, K Ishizuka, R Ishikawa, et al.
Microscopy (Oxford, England)|November 27, 2020
Advances in cryo-EM and ED with a cold-field emission beam and energy filtration -Refinements of the CRYO ARM 300 system in RIKEN SPring-8 centerSaori Maki-Yonekura, Tasuku Hamaguchi, Hisashi Naitow, et al.
Microscopy (Oxford, England)|October 31, 2021
Classifying liganded states in heterogeneous single-particle cryo-EM datasetsWilliam R Arnold, Daniel Asarnow, Yifan Cheng
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