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Nanotechnology|July 6, 2011
Differentiation of molecules in a mixed self-assembled monolayer of H-and Cl-terminated bicyclo[2.2.2]octane derivativesShintaro Fujii, Masamichi FujihiraNanotechnology|July 6, 2011
Lateral manipulation of atomic size defects on the CaF(2)(111) surfaceS Hirth, F Ostendorf, M ReichlingNanotechnology|July 6, 2011
Measuring phase shifts and energy dissipation with amplitude modulation atomic force microscopyNicolás F Martínez, Ricardo GarcíaNanotechnology|July 6, 2011
Novel amplitude and frequency demodulation algorithm for a virtual dynamic atomic force microscopeJ Kokavecz, Z Tóth, Z L Horváth, et al.Nanotechnology|July 6, 2011
A study of the topographic and electrical properties of self-assembled islands of alkylsilanes on mica using a combination of non-contact force microscopy techniquesM Luna, D F Ogletree, M SalmeronNanotechnology|July 6, 2011
Models of atomic scale contrast in dissipation images of binary ionic surfaces in non-contact atomic force microscopyT Trevethan, L KantorovichNanotechnology|July 6, 2011
Time-resolved photoluminescence spectroscopy of ligand-capped PbS nanocrystalsJamie H Warner, Elizabeth Thomsen, Andrew R Watt, et al.Nanotechnology|July 6, 2011
Contact force identification using the subharmonic resonance of a contact-mode atomic force microscopyEihab M Abdel-Rahman, Ali H NayfehNanotechnology|July 6, 2011
Calibration of silicon atomic force microscope cantileversChristopher T Gibson, D Alastair Smith, Clive J RobertsNanotechnology|July 6, 2011
High-voltage SPM oxidation of ZrN: materials for multiscale applicationsN Farkas, J R Comer, G Zhang, et al.Pageof 2,008