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Scanning|June 21, 2002
Direct assessment of recombination noise in semiconductors using electron beam-induced conductivityS Mil'shteinScanning|May 10, 2002
The method for the reconstruction of complex images of specimens using backscattered electronsDanuta Kaczmarek, Jaroslaw DomaradzkiScanning|May 10, 2002
Energy distribution of electron backscattering from crystals and relation to electron backscattering patterns and electron channeling patternsDirk Berger, Heinz NiedrigScanning|May 10, 2002
Cosmetic assessment of the human hair by confocal microscopyChristophe Hadjur, Gérard Daty, Geneviève Madry, et al.Scanning|August 21, 2003
Experimental resolution measurement in critical dimension scanning electron microscope metrologyG F Lorusso, D C JoyScanning|March 1, 1993
Microwave-accelerated cytochemical stains for the image analysis and the electron microscopic examination of light microscopy diagnostic slidesJ Hanker, B GiammaraScanning|March 1, 1993
A review of rapid microwave fixation technology: its expanding niche in morphologic studiesG R Login, A M DvorakScanning|May 1, 1993
Application of confocal laser scanning microscopy to analysis of H2O2-induced DNA damage in human cellsD Fairbairn, K L O'Neill, M D StandingScanning|November 9, 2018
A Method to Improve the Imaging Quality in Dual-Wavelength Digital Holographic MicroscopyYanan Zeng, Junsheng Lu, Xinyu Chang, et al.Pageof 133