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The Review of Scientific Instruments|March 3, 2017
Portable pyroelectric electron probe microanalyzer with a spot size of 40 μmSusumu Imashuku, Kazuaki WagatsumaThe Review of Scientific Instruments|March 3, 2017
A CMOS application-specified-integrated-circuit for 40 GHz high-electron-mobility-transistors automatic biasingM De Matteis, M De Blasi, E A Vallicelli, et al.The Review of Scientific Instruments|March 3, 2017
In situ correction of the spherical aberration in a double-toroidal electron analyzerXiao-Jing Liu, Christophe Nicolas, Catalin MironThe Review of Scientific Instruments|March 3, 2017
All-digital pulse-expansion-based CMOS digital-to-time converterChun-Chi Chen, Che-Hsun ChuThe Review of Scientific Instruments|March 3, 2017
High pressure rheology of gas hydrate formed from multiphase systems using modified Couette rheometerGaurav Pandey, Praveen Linga, Jitendra S SangwaiThe Review of Scientific Instruments|March 3, 2017
Note: Efficient diode laser line narrowing using dual, feed-forward + feed-back laser frequency controlM Lintz, D H Phung, J-P Coulon, et al.The Review of Scientific Instruments|March 3, 2017
Sample environment for neutron scattering measurements of internal stresses in engineering materials in the temperature range of 6 K to 300 KO Kirichek, J D Timms, J F Kelleher, et al.The Review of Scientific Instruments|March 3, 2017
Electro-optic modulation of a laser at microwave frequencies for interferometric purposesPaul E Specht, Brook A JilekThe Review of Scientific Instruments|March 3, 2017
Shutterless ion mobility spectrometer with fast pulsed electron sourceE Bunert, A Heptner, T Reinecke, et al.The Review of Scientific Instruments|March 3, 2017
New generation high performance in situ polarized 3He system for time-of-flight beam at spallation sourcesC Y Jiang, X Tong, D R Brown, et al.Pageof 2,069