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The Review of Scientific Instruments|April 6, 2013
Note: Detecting flow velocity with high purity semiconducting single-walled carbon nanotubesSeungho Lee, Wonsuk Jung, Ju Yeon Woo, et al.The Review of Scientific Instruments|May 3, 2013
Interferometric measurement of angular motionFabián Erasmo Peña Arellano, Hasnain Panjwani, Ludovico Carbone, et al.The Review of Scientific Instruments|May 3, 2013
Photoionization of optically trapped ultracold atoms with a high-power light-emitting diodeSimone Götz, Bastian Höltkemeier, Thomas Amthor, et al.The Review of Scientific Instruments|May 3, 2013
Evanescent straight tapered-fiber coupling of ultra-high Q optomechanical micro-resonators in a low-vibration helium-4 exchange-gas cryostatR Rivière, O Arcizet, A Schliesser, et al.The Review of Scientific Instruments|May 3, 2013
Measurements with magnetic field in the National Spherical Torus Experiment using the motional Stark effect with laser induced fluorescence diagnosticE L Foley, F M LevintonThe Review of Scientific Instruments|May 3, 2013
A spectrometer on chemical vapour deposition-diamond basis for the measurement of the charge-state distribution of heavy ions in a laser-generated plasmaWitold Cayzac, Alexander Frank, Dennis Schumacher, et al.The Review of Scientific Instruments|May 3, 2013
Conceptual design of the tangentially viewing combined interferometer-polarimeter for ITER density measurementsM A Van Zeeland, R L Boivin, D L Brower, et al.The Review of Scientific Instruments|May 3, 2013
Electron-ion hybrid instability experiment upgrades to the Auburn Linear Experiment for Instability StudiesA M DuBois, I Arnold, E Thomas, et al.The Review of Scientific Instruments|May 3, 2013
Electrokinetic microscopy: a technique for imaging three-dimensional surface topography and heterogeneity of surface materialG H Kwon, T Y Kim, S J KimThe Review of Scientific Instruments|May 3, 2013
Pulsed laser deposition with simultaneous in situ real-time monitoring of optical spectroscopic ellipsometry and reflection high-energy electron diffractionJ H Gruenewald, J Nichols, S S A SeoPageof 2,068