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The Review of Scientific Instruments|December 2, 2009
Continuous wave terahertz wave spectrometer based on diode laser pumping: potential applications in high resolution spectroscopyTadao Tanabe, Srinivasa Ragam, Yutaka OyamaThe Review of Scientific Instruments|December 2, 2009
Electron density measurements of a field-reversed configuration plasma using a novel compact ultrastable second-harmonic interferometerF Brandi, F Giammanco, W S Harris, et al.The Review of Scientific Instruments|December 2, 2009
Improvement of windowed type environmental-cell transmission electron microscope for in situ observation of gas-solid interactionsTadahiro Kawasaki, Kouta Ueda, Mikio Ichihashi, et al.The Review of Scientific Instruments|December 2, 2009
A diffraction-limited scanning system providing broad spectral range for laser scanning microscopyJiun-Yann Yu, Chien-Sheng Liao, Zong-Yan Zhuo, et al.The Review of Scientific Instruments|December 2, 2009
Stage for texture measurements above room temperature in a Philips X'Pert Pro MPD diffractometerCésar E Sobrero, Daniel Castellani, Raúl E Bolmaro, et al.The Review of Scientific Instruments|December 2, 2009
Thickness-induced resonance-based complex permittivity measurement technique for barium strontium titanate ceramics at microwave frequencySong Xia, Zhuo Xu, Xiaoyong WeiThe Review of Scientific Instruments|December 2, 2009
Electrically detected magnetic resonance using radio-frequency reflectometryH Huebl, R P Starrett, D R McCamey, et al.The Review of Scientific Instruments|December 2, 2009
Development of a straightness measurement and compensation system with multiple right-angle reflectors and a lead zirconate titanate-based compensation stageChien-Hung Liu, Jui-Hung Chen, Yun-Feng TengThe Review of Scientific Instruments|December 2, 2009
Measurement system of the refractive power of spherical and sphero-cylindrical lenses with the magnification ellipse fitting methodWooseok Ko, Soohyun KimThe Review of Scientific Instruments|December 2, 2009
Successive large perturbation method for the elimination of initial value dependence in I-V curve fittingJinhua Cai, Norifusa Satoh, Masatoshi Yanagida, et al.Pageof 2,068