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Ultramicroscopy|September 9, 2023
Edge-induced excitations in Bi<sub>2</sub>Te<sub>3</sub> from spatially-resolved electron energy-gain spectroscopyHelena La, Abel Brokkelkamp, Stijn van der Lippe, et al.Ultramicroscopy|January 1, 1980
Scanning transmission electron microscopy of biological macromoleculesW Tichelaar, G T Oostergetel, J Haker, et al.Ultramicroscopy|December 1, 1976
Kodirex for high resolution electron microscopyD Dorignac, M E Maclachlan, B JouffreyUltramicroscopy|June 13, 2026
A single multi-configuration direct electron detector for various electron imaging and diffraction-based techniques in SEMNohayla El-Khairaoui, Julien Guyon, Nathalie Gey, et al.Ultramicroscopy|November 12, 2003
Is atomic resolution transmission electron microscopy able to resolve and refine amorphous structures?D Van Dyck, S Van Aert, A J den Dekker, et al.Ultramicroscopy|September 5, 2002
Mapping and control of atomic force on Si(1 1 1)square root(3) x square root(3)-Ag surface using noncontact atomic force microscopeS Morita, Y SugawaraUltramicroscopy|September 6, 2002
Combined microscope for scanning X-ray transmission and surface topographyM T Browne, P Charalambous, R E Burge, et al.Ultramicroscopy|September 6, 2002
Application of Nomarski interference contrast microscopy as a thickness monitor in the preparation of transparent, SiC-based, cross-sectional TEM samplesE A Preble, H A McLean, S M Kiesel, et al.Ultramicroscopy|January 22, 2003
Nanomaterials for field electron emission: preparation, characterization and applicationNing Sheng Xu, Shao Zhi Deng, Jun ChenUltramicroscopy|January 22, 2003
Time-of-flight atom probe measurements on Ni3Al and Co3WW A Soer, P M Bronsveld, J Th M De HossonPageof 458