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Ultramicroscopy|January 5, 2002
Characterization of nanoscaled heterogeneities in mechanically alloyed and compacted CuFeN Wanderka, U Czubayko, V Naundorf, et al.Ultramicroscopy|March 30, 2004
HREM, FIM and tomographic atom probe investigation of Guinier-Preston zones in an Al-1.54at% Cu alloyM Karlík, A Bigot, B Jouffrey, et al.Ultramicroscopy|February 24, 2012
40 keV atomic resolution TEMDavid C Bell, Christopher J Russo, Dmitry V KolmykovUltramicroscopy|August 26, 2011
Electron tomography combining ESEM and STEM: a new 3D imaging techniqueP Jornsanoh, G Thollet, J Ferreira, et al.Ultramicroscopy|June 26, 2012
Using a monochromator to improve the resolution in TEM to below 0.5 Å. Part II: application to focal series reconstructionP C Tiemeijer, M Bischoff, B Freitag, et al.Ultramicroscopy|July 4, 2012
Development and application of STEM for the biological sciencesAlioscka A Sousa, Richard D LeapmanUltramicroscopy|July 9, 2013
On the optical stability of high-resolution transmission electron microscopesJ Barthel, A ThustUltramicroscopy|April 23, 2013
Characterization of detector modulation-transfer function with noise, edge, and holographic methodsRobert A McLeod, Marek MalacUltramicroscopy|September 21, 2013
Effect of horizontal magnetization reversal of the tips on magnetic force microscopy imagesAlexander Alekseev, Anatoliy Popkov, Andrey Shubin, et al.Ultramicroscopy|August 1, 2016
Comprehensive analysis of TEM methods for LiFePO<sub>4</sub>/FePO<sub>4</sub> phase mapping: spectroscopic techniques (EFTEM, STEM-EELS) and STEM diffraction techniques (ACOM-TEM)X Mu, A Kobler, D Wang, et al.Pageof 458