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Ultramicroscopy|April 27, 2000
Analysis of local strain in aluminium interconnects by energy filtered CBEDKramer, Mayer, Witt, et al.Ultramicroscopy|April 27, 2000
Rietveld analysis of electron powder diffraction data from nanocrystalline anatase, TiO2Weirich, Winterer, Seifried, et al.Ultramicroscopy|January 17, 2002
Characterization of AC mode scanning ion-conductance microscopyD Pastré, H Iwamoto, J Liu, et al.Ultramicroscopy|January 17, 2002
Imaging charged objects using low-energy-electron coherent beamsV Georges, J Bardon, A Degiovanni, et al.Ultramicroscopy|January 17, 2002
Wave field restoration using three-dimensional Fourier filtering methodT Kawasaki, Y Takai, T Ikuta, et al.Ultramicroscopy|January 17, 2002
Negative staining permits 4.0 A resolution with low-dose electron diffraction of catalase crystalsW H Massover, P F Lai, P MarshUltramicroscopy|January 5, 2002
Prototypes using metal, carbon fiber and composite field emission sources modulated by a laser beamM S Mousa, M Brugat, E P Sheshin, et al.Ultramicroscopy|January 5, 2002
Nanometer-scale solute segregation at heterophase interfaces and microstructural evolution of molybdenum nitride precipitatesD Isheim, E J Siem, D N SeidmanUltramicroscopy|January 5, 2002
Subnanometer three-dimensional atom-probe investigation of segregation at MgO/Cu ceramic/metal heterophase interfacesJ T Sebastian, J Rüsing, O C Hellman, et al.Ultramicroscopy|January 5, 2002
On the increase of the intensity ratio of doubly charged ions to singly charged ions for liquid gold and copper ion sourcesY Gotoh, H Tsuji, J IshikawaPageof 460