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Ultramicroscopy|March 3, 2022
Effects of atom probe analysis parameters on composition measurement of precipitates in an Al-Mg-Si-Cu alloyShenbao Jin, Haokai Su, Feng Qian, et al.Ultramicroscopy|March 4, 2022
A user-friendly FIB lift-out technique to prepare plan-view TEM sample of 2D thin film materialsNitul S Rajput, Karen Sloyan, Dalaver H Anjum, et al.Ultramicroscopy|September 23, 2021
A semi-classical theory of magnetic inelastic scattering in transmission electron energy loss spectroscopyB G MendisUltramicroscopy|May 8, 2019
Direct observation of magnetic contrast obtained by photoemission electron microscopy with deep ultra-violet laser excitationY C Zhao, H C Lyu, G Yang, et al.Ultramicroscopy|October 13, 2018
A single slice approach for simulating two-beam electron diffraction of nanocrystalsLionel Cervera Gontard, Adrián Barroso-Bogeat, Rafal E Dunin-Borkowski, et al.Ultramicroscopy|April 24, 1999
Parallel electron energy-loss spectroscopy free from gain variationJ L Feng, R Ho, Z Shao, et al.Ultramicroscopy|April 24, 1999
A new algorithm to align three-dimensional maps of helical structuresD Hanein, D DeRosierUltramicroscopy|June 1, 1976
Electronmicroscopic mass determination using photographic isodensity techniquesM K LamvikUltramicroscopy|June 1, 1976
Direct phase determination for quasi-kinematical electron diffraction intensity data from organic microcrystalsD L Dorset, H A HauptmanPageof 458