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Ultramicroscopy|March 31, 2012
Simultaneous and independent adaptive correction of spherical and chromatic aberration using an electron mirror and lens combinationJ P S Fitzgerald, R C Word, R KönenkampUltramicroscopy|February 18, 2022
Minimum-dose phase-contrast tomography by successive numerical optical sectioning employing the aberration-corrected STEM and a pixelated detectorHarald RoseUltramicroscopy|February 5, 2022
The Performance of EDXS at Elevated Sample Temperatures Using a MEMS-Based In Situ TEM Heating SystemRobert Krisper, Judith Lammer, Yevheniy Pivak, et al.Ultramicroscopy|February 13, 2022
Controlling the parameters of focused ion beam for ultra-precise fabrication of nanostructuresA S Kolomiytsev, A L Gromov, O I Il'in, et al.Ultramicroscopy|March 29, 2022
AutomAl 6000: Semi-automatic structural labelling of HAADF-STEM images of precipitates in Al-Mg-Si(-Cu) alloysHaakon Tvedt, Calin D Marioara, Elisabeth Thronsen, et al.Ultramicroscopy|January 1, 1986
Contrast and resolution of scanning transmission electron microscope imaging modesR Reichelt, A EngelUltramicroscopy|March 3, 2022
Effects of atom probe analysis parameters on composition measurement of precipitates in an Al-Mg-Si-Cu alloyShenbao Jin, Haokai Su, Feng Qian, et al.Ultramicroscopy|March 4, 2022
A user-friendly FIB lift-out technique to prepare plan-view TEM sample of 2D thin film materialsNitul S Rajput, Karen Sloyan, Dalaver H Anjum, et al.Ultramicroscopy|September 23, 2021
A semi-classical theory of magnetic inelastic scattering in transmission electron energy loss spectroscopyB G MendisPageof 460