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Ultramicroscopy|June 1, 1976
Quantitative tensile-tilting stages for the high voltage electron microscopeU Messerschmidt, F AppelUltramicroscopy|September 1, 1976
Contribution of electron energy loss spectroscopy to the development of analytical electron microscopyC Colliex, V E Cosslett, R D Leapman, et al.Ultramicroscopy|January 1, 1979
The reconstruction of a helical structure from projections applied to a phage tailA F Cremers, J C Fischer, J E MellemaUltramicroscopy|September 22, 2000
QED v 1.0: a software package for quantitative electron diffraction data treatmentD Belletti, G Calestani, M Gemmi, et al.Ultramicroscopy|September 22, 2000
Use of reciprocal lattice layer spacing in electron backscatter diffraction pattern analysisMichael, EadesUltramicroscopy|September 22, 2000
A novel in-lens detector for electrostatic scanning LEEM mini-columnFrank, Mullerova, el Gomati MMUltramicroscopy|September 12, 2000
The use of a phi(rhoz) model for simultaneous determination of composition and thickness in analytical transmission electron microscopyBoon, BastinUltramicroscopy|February 24, 2001
Macroscopic water deposits on polycrystalline gold measured by scanning force microscopyA Gil, J Colchero, J Gómez-Herrero, et al.Ultramicroscopy|February 24, 2001
Investigation by atomic force microscopy of forces at the origin of cement cohesionS Lesko, E Lesniewska, A Nonat, et al.Ultramicroscopy|February 24, 2001
Comparative studies of bacteria with an atomic force microscopy operating in different modesA V Bolshakova, O I Kiselyova, A S Filonov, et al.Pageof 458