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Ultramicroscopy|November 12, 2003
Rattling modes and the intrinsic vibrational spectrum of beetle-type scanning tunneling microscopesJ A Miwa, J M MacLeod, Antje Moffat, et al.Ultramicroscopy|November 12, 2003
Lattice measurement and alloy compositions in metal and bimetallic nanoparticlesS-C Y Tsen, P A Crozier, J LiuUltramicroscopy|June 29, 2004
Cluster analysis of soft X-ray spectromicroscopy dataM Lerotic, C Jacobsen, T Schäfer, et al.Ultramicroscopy|June 29, 2004
Three-dimensional distributions of elements in biological samples by energy-filtered electron tomographyR D Leapman, E Kocsis, G Zhang, et al.Ultramicroscopy|July 3, 2004
Analysis of force curves obtained on the live cell membrane using chemically modified AFM probesRehana Afrin, Takafumi Yamada, Atsushi IkaiUltramicroscopy|July 3, 2004
On the electromechanical modelling of a resonating nano-cantilever-based transducerJ Teva, G Abadal, Z J Davis, et al.Ultramicroscopy|July 3, 2004
Calibration of AFM cantilever stiffness: a microfabricated array of reflective springsP J Peter J Cumpson, Peter Zhdan, John HedleyUltramicroscopy|May 20, 2004
The tuning of a Zernike phase plate with defocus and variable spherical aberration and its use in HRTEM imagingM LentzenUltramicroscopy|May 20, 2004
Shear force distance control in a scanning near-field optical microscope: in resonance excitation of the fiber probe versus out of resonance excitationD A Lapshin, V S Letokhov, G T Shubeita, et al.Ultramicroscopy|April 20, 2004
Imaging and thickness measurement of amorphous intergranular films using TEMI MacLarenPageof 460