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Ultramicroscopy|April 1, 1977
Scherzer's formula and the correction of spiral distortion in the electron microscopeF Z Marai, T MulveyUltramicroscopy|April 1, 1977
Partial fraction expansion of electron optical cardinal elementsP SchiskeUltramicroscopy|April 1, 1977
The bright and shadow images of an atom in the transmission electron microscopeR UyedaUltramicroscopy|May 19, 2015
Characterization of ion-irradiation-induced nanodot structures on InP surfaces by atom probe tomographyHubert Gnaser, Tobias RadnyUltramicroscopy|June 25, 2010
A precession electron diffraction study of alpha, beta phases and Dauphiné twin in quartzD Jacob, P CordierUltramicroscopy|February 22, 2011
In situ analysis of gas composition by electron energy-loss spectroscopy for environmental transmission electron microscopyPeter A Crozier, Santhosh ChennaUltramicroscopy|February 5, 2011
Characteristics of cross-sectional atom probe analysis on semiconductor structuresS Koelling, N Innocenti, G Hellings, et al.Ultramicroscopy|February 5, 2011
Low-threshold field emission from carbon nano-clustersA Yafyasov, V Bogevolnov, G Fursey, et al.Ultramicroscopy|March 1, 2011
From 2D slices to 3D volumes: image based reconstruction and morphological characterization of hippocampal cells on charged and uncharged surfaces using FIB/SEM serial sectioningFranziska Schmidt, Markus Kühbacher, Ulrich Gross, et al.Ultramicroscopy|March 1, 2011
Measuring and correcting aberrations of a cathode objective lensR M TrompPageof 460