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Ultramicroscopy|March 15, 2011
A practical method to determine the effective resolution in incoherent experimental electron tomographyHamed Heidari Mezerji, Wouter Van den Broek, Sara BalsUltramicroscopy|March 21, 1998
Imaging two-dimensional arrays of soluble proteins by atomic force microscopy in contact mode using a sharp supertipT Furuno, H Sasabe, A IkegamiUltramicroscopy|January 1, 1980
Correction of the second-order aberrations of uniform field magnetic sectorsH ShumanUltramicroscopy|May 15, 2020
Numerically robust tetrahedron-based tomographic forward and backward projectors on parallel architecturesAnder Biguri, Hossein Towsyfyan, Richard Boardman, et al.Ultramicroscopy|May 15, 2020
An algorithm for correcting systematic energy deficits in the atom probe mass spectra of insulating samplesBenjamin W Caplins, Paul T Blanchard, Ann N Chiaramonti, et al.Ultramicroscopy|May 16, 2020
Conductivity models for electron energy loss spectroscopy of graphene in a scanning transmission electron microscope with high energy resolutionKeenan Lyon, Duncan J Mowbray, Zoran L MiskovicUltramicroscopy|May 17, 2020
Achieving diffraction-limited resolution in soft-X-ray Fourier-transform holographyJan Geilhufe, Bastian Pfau, Christian M Günther, et al.Ultramicroscopy|May 17, 2020
Observer Design for Topography Estimation in Atomic Force Microscopy Using Neural and Fuzzy NetworksMohammad Rafiee Javazm, Hossein Nejat PishkenariUltramicroscopy|May 12, 2020
Quantitative analysis of spectroscopic low energy electron microscopy data: High-dynamic range imaging, drift correction and cluster analysisT A de Jong, D N L Kok, A J H van der Torren, et al.Ultramicroscopy|September 3, 2021
Transmission Kikuchi diffraction: The impact of the signal-to-noise ratioTomasz Tokarski, Gert Nolze, Aimo Winkelmann, et al.Pageof 460