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Ultramicroscopy|May 21, 2021
Reconstructing porous structures from FIB-SEM image data: Optimizing sampling scheme and image processingDiego Roldán, Claudia Redenbach, Katja Schladitz, et al.Ultramicroscopy|August 8, 2021
Numerical simulations of field emission characteristics of open CNTSergey Vladimirovich Filippov, Eugeni Olegovich Popov, Anatoly Grigorievich KoloskoUltramicroscopy|February 16, 2023
A decade of atom-counting in STEM: From the first results toward reliable 3D atomic models from a single projectionA De Backer, S Bals, S Van AertUltramicroscopy|April 3, 2001
Orientation dependence of ionization edges in EELSP Schattschneider, C Hébert, B JouffreyUltramicroscopy|March 31, 2000
Amplitude curves and operating regimes in dynamic atomic force microscopyGarcia, San Paulo AUltramicroscopy|March 31, 2000
Data analysis of interaction forces measured with the atomic force microscopeBaumgartner, Hinterdorfer, SchindlerUltramicroscopy|March 31, 2000
Scanning tunneling microscopy nanofabrication of electronic industry compatible thermal Si oxideLi, Yoshinobu, IwasakiUltramicroscopy|March 31, 2000
Lift-off patterning of thin Au films on Si surfaces with atomic force microscopyMoon, Yoshinobu, IwasakiPageof 460