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Ultramicroscopy|April 27, 2000
Computation of contrasts in atomic resolution electron spectroscopic images of planar defects in crystalline specimensNavidi-Kasmai, KohlUltramicroscopy|April 27, 2000
Surface structural sensitivity of convergent-beam RHEED: Si (0 0 1) 2 x 1 models compared with dynamical simulationsZuo, Weierstall, Peng, et al.Ultramicroscopy|July 15, 2000
Structure determination of tubular crystals of membrane proteins. I. Indexing of diffraction patternsC ToyoshimaUltramicroscopy|July 15, 2000
Structure determination of tubular crystals of membrane proteins. III. Solvent flatteningK Yonekura, C ToyoshimaUltramicroscopy|July 15, 2000
Automated identification of symmetry in CBED patterns: a genetic approachHu, Peng, Yu, et al.Ultramicroscopy|October 3, 2000
Alignment of AFM images using an iterative mathematical procedureRomer, Plaschke, KimUltramicroscopy|January 14, 2003
Improving the analysis of small precipitates in HSLA steels using a plasma cleaner and ELNESJ A Wilson, A J CravenUltramicroscopy|January 14, 2003
A novel STM-assisted microwave microscope with capacitance and loss imaging capabilityAtif Imtiaz, Steven M AnlageUltramicroscopy|January 22, 2003
Some comments on models for field enhancementRichard G Forbes, C J Edgcombe, U ValdrèPageof 458