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Ultramicroscopy|July 26, 2002
Investigations on field-ion image formation and field evaporation sequences of DO3-ordered Fe3AlGeorg Frommeyer, Zhi-Guo Liu, Jürgen Wesemann, et al.Ultramicroscopy|December 1, 1975
A method for the improvement of the visibility of transmission electron microscope imagesW M Stobbs, U ValdrèUltramicroscopy|July 1, 1975
On dark field techniques in transmission electron microscopyK Shirota, T Yamamoto, T YanakaUltramicroscopy|December 1, 1975
Aperture contrast in thick amorphous specimens using scanning transmission electron microscopyD J Smith, J M CowleyUltramicroscopy|July 21, 2001
Beam characteristics for various sizes of annular aperture on scanning electron microscopeT Ishitani, M Sato, H TodokoroUltramicroscopy|July 21, 2001
The concept of high angle wedge polishing and thickness monitoring in TEM sample preparationH Li, L Salamanca-RibaUltramicroscopy|June 1, 1995
Automatic particle picking from electron micrographsK R Lata, P Penczek, J FrankUltramicroscopy|February 1, 1996
The discrimination of IgM and IgG type antibodies and Fab' and F(ab)2 antibody fragments on an industrial substrate using scanning force microscopyC J Roberts, M C Davies, S J Tendler, et al.Ultramicroscopy|February 1, 1996
A characterisation of dark-field imaging of colloidal gold labels in a scanning transmission X-ray microscopeH N Chapman, C Jacobsen, S WilliamsUltramicroscopy|December 17, 2016
Assessing and ameliorating the influence of the electron beam on carbon nanotube oxidation in environmental transmission electron microscopyAi Leen Koh, Robert SinclairPageof 460