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Ultramicroscopy|November 30, 2016
A novel PFIB sample preparation protocol for correlative 3D X-ray CNT and FIB-TOF-SIMS tomographyAgnieszka Priebe, Guillaume Audoit, Jean-Paul BarnesUltramicroscopy|December 3, 2016
Nanostructural characterization of artificial pinning centers in PLD-processed REBa2Cu3O7-δ filmsT Maeda, K Kaneko, K Yamada, et al.Ultramicroscopy|December 3, 2016
Beamstop-based low-background ptychography to image weakly scattering objectsJuliane Reinhardt, Robert Hoppe, Georg Hofmann, et al.Ultramicroscopy|December 7, 2016
Advanced electron holography techniques for in situ observation of solid-state lithium ion conductorsTsukasa Hirayama, Yuka Aizawa, Kazuo Yamamoto, et al.Ultramicroscopy|October 11, 2016
Structure assisted compressed sensing reconstruction of undersampled AFM imagesChristian Schou Oxvig, Thomas Arildsen, Torben LarsenUltramicroscopy|October 30, 2016
Can we use PCA to detect small signals in noisy data?Jakob Spiegelberg, Ján RuszUltramicroscopy|April 1, 2017
Electron-beam-induced-current and active secondary-electron voltage-contrast with aberration-corrected electron probesMyung-Geun Han, Joseph A Garlow, Matthew S J Marshall, et al.Ultramicroscopy|April 2, 2017
Super-resolved 3-D imaging of live cells' organelles from bright-field photon transmission micrographsRenata Rychtáriková, Tomáš Náhlík, Kevin Shi, et al.Ultramicroscopy|April 6, 2017
Getting the most out of a post-column EELS spectrometer on a TEM/STEM by optimising the optical couplingAlan J Craven, Hidetaka Sawada, Sam McFadzean, et al.Ultramicroscopy|April 7, 2017
Focused ion beam-assisted fabrication of soft high-aspect ratio silicon nanowire atomic force microscopy probesPeter Knittel, Nicolas Hibst, Boris Mizaikoff, et al.Pageof 460