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Ultramicroscopy|July 1, 1994
Performance of thin foil scintillating screen for transmission electron microscopyG Y Fan, D G Dunkelberger, M H EllismanUltramicroscopy|January 1, 1984
Diffraction patterns from stained and unstained helices: consistency or contradiction?B L Trus, A C StevenUltramicroscopy|March 1, 1995
A method for 2D crystallization of soluble proteins at liquid-liquid interfaceK Aoyama, K Ogawa, Y Kimura, et al.Ultramicroscopy|August 26, 2022
Photovoltaic and photothermal effects induced by visible laser radiation in atomic force microscopy probesM D Pichois, X Henning, M A Hurier, et al.Ultramicroscopy|February 14, 2021
Principal image decomposition for multi-detector backscatter electron topography reconstructionJan Neggers, Eva Héripré, Marc Bonnet, et al.Ultramicroscopy|February 19, 2021
Plasmon energy losses in shear bands of metallic glassMaximilian Grove, Martin Peterlechner, Harald Rösner, et al.Ultramicroscopy|January 1, 1988
Observations of restricted beam-induced specimen motion with small-spot illuminationK H DowningUltramicroscopy|September 3, 2019
Tunable electron beam pulser for picoseconds stroboscopic microscopy in transmission electron microscopesChunguang Jing, Yimei Zhu, Ao Liu, et al.Ultramicroscopy|September 24, 2019
Ni-base superalloy single crystal (SX) mosaicity characterized by the Rotation Vector Base Line Electron Back Scatter Diffraction (RVB-EBSD) methodP Thome, S Medghalchi, J Frenzel, et al.Ultramicroscopy|August 18, 2019
Quantitative analysis of electron channeling contrast of dislocationsIvan Gutierrez-UrrutiaPageof 458