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Ultramicroscopy|January 11, 2005
Some effects of electron channeling on electron energy loss spectroscopyEarl J KirklandUltramicroscopy|January 11, 2005
A simple electron-beam lithography systemKristian Mølhave, Dorte Nørgaard Madsen, Peter BøggildUltramicroscopy|January 11, 2005
Spectroscopy of the shear force interaction in scanning near-field optical microscopyStefan Hoppe, Georgios Ctistis, Jens J Paggel, et al.Ultramicroscopy|February 8, 2005
The spatial resolution of imaging using core-loss spectroscopy in the scanning transmission electron microscopeE C Cosgriff, M P Oxley, L J Allen, et al.Ultramicroscopy|May 19, 2005
Comments on "Observation of the surface stress induced in microcantilevers by electrochemical redox processes" by F. Tian, J.H. Pei, D.L. Hedden, G.M. Brown, T. ThundatG G Láng, T A Rokob, G HorányiUltramicroscopy|September 29, 2004
Role of multipole moment of the probe in apertureless near-field optical microscopyS V SukhovUltramicroscopy|September 29, 2004
Coherent inelastic scattering in Si and TiAlAlexander F Moodie, Tobias A Colson, Harold J WhitfieldUltramicroscopy|September 29, 2004
Off-axis electron holography without Fresnel fringesKazuo Yamamoto, Tsukasa Hirayama, Takayoshi TanjiUltramicroscopy|March 19, 2005
Error tolerance of an iterative phase retrieval algorithm for moveable illumination microscopyH M L Faulkner, J M RodenburgPageof 458