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Ultramicroscopy|November 24, 2004
Location specific in situ TEM straining specimens made using FIBR D Field, P A PapinUltramicroscopy|November 24, 2004
Influence of the atomic force microscope tip on the multifractal analysis of rough surfacesPetr Klapetek, Ivan Ohlídal, Jindrich BílekUltramicroscopy|February 8, 2005
Adhesion mode atomic force microscopy study of dual component protein filmsAashiish Agnihotri, Christopher A SiedleckiUltramicroscopy|January 1, 2008
Electron cryo-microscopy of biological specimens on conductive titanium-silicon metal glass filmsDaniel Rhinow, Werner KühlbrandtUltramicroscopy|March 11, 2008
Characterization of JEOL 2100F Lorentz-TEM for low-magnification electron holography and magnetic imagingM A Schofield, M Beleggia, Y Zhu, et al.Ultramicroscopy|January 3, 2006
Atomic force microscopy tips (cantilevers) as molecular nucleic acid sensorsCengiz Koçum, S Doğutan Ulgen, Emrecan Cubukçu, et al.Ultramicroscopy|December 7, 2007
Prerequisites for a Cc/Cs-corrected ultrahigh-resolution TEMM Haider, H Müller, S Uhlemann, et al.Ultramicroscopy|December 28, 2007
Effects of tilt on high-resolution ADF-STEM imagingS E Maccagnano-Zacher, K A Mkhoyan, E J Kirkland, et al.Ultramicroscopy|May 10, 2008
Iterative control approach to high-speed force-distance curve measurement using AFM: time-dependent response of PDMS exampleKyong-Soo Kim, Zhiqun Lin, Pranav Shrotriya, et al.Pageof 460