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Ultramicroscopy|December 7, 2007
Prerequisites for a Cc/Cs-corrected ultrahigh-resolution TEMM Haider, H Müller, S Uhlemann, et al.
Ultramicroscopy|December 28, 2007
Effects of tilt on high-resolution ADF-STEM imagingS E Maccagnano-Zacher, K A Mkhoyan, E J Kirkland, et al.
Ultramicroscopy|December 7, 2007
An electron microscope for the aberration-corrected eraO L Krivanek, G J Corbin, N Dellby, et al.
Ultramicroscopy|April 9, 2008
Symmetry in electron diffractions from helical structuresJiong Zhang, Jing Zhu
Ultramicroscopy|April 9, 2008
AFM picking-up manipulation of the metaphase chromosome fragment by using the tweezers-type probeKeiichiro Yamanaka, Masato Saito, Motoharu Shichiri, et al.
Ultramicroscopy|December 11, 2007
Planar diffracted-beam interferometry/holographyR A Herring
Ultramicroscopy|June 3, 2008
A simple method for AFM tip characterization by polystyrene spheresZhi-Gang Zeng, Guo-dong Zhu, Zhang Guo, et al.
Ultramicroscopy|January 17, 2025
An applied noise model for low-loss EELS mapsChristian Zietlow, Jörg K N Lindner
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