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Ultramicroscopy|August 8, 2006
Reducing the missing wedge: High-resolution dual axis tomography of inorganic materialsIlke Arslan, Jenna R Tong, Paul A MidgleyUltramicroscopy|September 23, 2006
The contrast-imaging function for tilted specimensAnsgar Philippsen, Hans-Andreas Engel, Andreas EngelUltramicroscopy|September 26, 2006
Quantification of the size-dependent energy gap of individual CdSe quantum dots by valence electron energy-loss spectroscopyRolf Erni, Nigel D BrowningUltramicroscopy|July 26, 2006
First-principles multi-electron calculations for L(2,3) ELNES/XANES of 3d transition metal monoxidesHidekazu Ikeno, Teruyasu Mizoguchi, Yukinori Koyama, et al.Ultramicroscopy|August 19, 2006
Prospects for 3D, nanometer-resolution imaging by confocal STEMJ J Einspahr, P M VoylesUltramicroscopy|July 18, 2006
Modelling high-resolution electron microscopy based on core-loss spectroscopyL J Allen, S D Findlay, M P Oxley, et al.Ultramicroscopy|March 3, 2007
Holey carbon micro-arrays for transmission electron microscopy: a microcontact printing approachDavid W Chester, James F Klemic, Eric Stern, et al.Ultramicroscopy|February 13, 2007
Quantitative amplitude and phase contrast imaging in a scanning transmission X-ray microscopeBenjamin Hornberger, Michael Feser, Chris JacobsenUltramicroscopy|February 13, 2007
Response analysis for identifying the origin of photo-modulated current contrasts in scanning tunneling microscopic imaging semiconductor surfacesNobuyasu Naruse, Yutaka Mera, Yukinobu Hayashida, et al.Ultramicroscopy|March 22, 2007
Jumping mode AFM imaging of biomolecules in the repulsive electrical double layerJ Sotres, A Lostao, C Gómez-Moreno, et al.Pageof 458