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Ultramicroscopy|February 1, 1993
Prospects for using an IVEM with a FEG for imaging macromolecules towards atomic resolutionZ H Zhou, W ChiuUltramicroscopy|November 21, 2016
Experimental evidence concerning the significant information depth of electron backscatter diffraction (EBSD)Wolfgang Wisniewski, Stefan Saager, Andrea Böbenroth, et al.Ultramicroscopy|May 20, 2004
Investigation of influence of gas atmosphere and pressure upon non-contact atomic force microscopyYasumasa Suzuki, Hirotoshi Enoki, Etsuo AkibaUltramicroscopy|May 20, 2004
JECP/PCED--a computer program for simulation of polycrystalline electron diffraction pattern and phase identificationX Z LiUltramicroscopy|March 12, 2004
Simulation of electron energy loss near-edge structure at the Al and N K edges and Al L(23) edge in cubic aluminium nitrideJ C Le Bossé, M Sennour, C Esnouf, et al.Ultramicroscopy|July 3, 2004
Atomic force microscopy of BHK-21 cells: an investigation of cell fixation techniquesM Moloney, L McDonnell, H O'SheaUltramicroscopy|July 3, 2004
Atomic force microscopy analysis of enveloped and non-enveloped viral entry into, and egress from, cultured cellsM Moloney, L McDonnell, H O'SheaUltramicroscopy|July 3, 2004
Cell wall modification in grapevine cells in response to UV stress investigated by atomic force microscopyE Lesniewska, M Adrian, A Klinguer, et al.Ultramicroscopy|July 3, 2004
Observation of the surface stress induced in microcantilevers by electrochemical redox processesF Tian, J H Pei, D L Hedden, et al.Ultramicroscopy|July 3, 2004
A torsional resonance mode AFM for in-plane tip surface interactionsLin Huang, Chanmin SuPageof 458