Search research articles
Contact Us
Filters
Showing results (161-170 of 4,741) with videos related to
Page
of 475
Sort By:
Ultramicroscopy
|
December 7, 2007
High-resolution scanning near-field EBIC microscopy: application to the characterisation of a shallow ion implanted p+-n silicon junction
K Smaali, J Fauré, A El Hdiy, et al.
Ultramicroscopy
|
January 21, 2006
Quantitative Fresnel Lorentz microscopy and the transport of intensity equation
S McVitie, M Cushley
Ultramicroscopy
|
February 21, 2006
Lensless electron reflection microscopy using a coaxial point-source structure
Zoubida Hammadi, Roger Morin
Ultramicroscopy
|
December 8, 2007
Real-time imaging of surface evolution driven by variable-energy ion irradiation
W Swiech, M Rajappan, M Ondrejcek, et al.
Ultramicroscopy
|
January 3, 2026
Assessing the electric field sensitivity measured by pixelated differential phase contrast imaging in vacuum both in the absence of external fields and under field-bound conditions
Pierpaolo Ranieri, Reinis Ignatans, Victor Boureau, et al.
Ultramicroscopy
|
January 3, 2006
Bioelectromechanical imaging by scanning probe microscopy: Galvani's experiment at the nanoscale
Sergei V Kalinin, B J Rodriguez, J Shin, et al.
Ultramicroscopy
|
January 3, 2006
Diffraction of 0.5keV electrons from free-standing transmission gratings
Ben McMorran, John D Perreault, T A Savas, et al.
Ultramicroscopy
|
February 7, 2006
CBED contrast in the lower order Laue zone
C J Rossouw, C J Maunders, H J Whitfield, et al.
Ultramicroscopy
|
January 18, 2006
On the importance of precise calibration techniques for an atomic force microscope
R J Emerson, T A Camesano
Ultramicroscopy
|
April 1, 1992
3D reconstruction from the Fourier transform of a single superlattice image of an oblique section
K A Taylor, R A Crowther
Page
of 475
Search research articles
Search
Showing results (161-170 of 4,741) with videos related to
Sort By:
Page
of 475
Ultramicroscopy
|
December 7, 2007
High-resolution scanning near-field EBIC microscopy: application to the characterisation of a shallow ion implanted p+-n silicon junction
K Smaali, J Fauré, A El Hdiy, et al.
Ultramicroscopy
|
January 21, 2006
Quantitative Fresnel Lorentz microscopy and the transport of intensity equation
S McVitie, M Cushley
Ultramicroscopy
|
February 21, 2006
Lensless electron reflection microscopy using a coaxial point-source structure
Zoubida Hammadi, Roger Morin
Ultramicroscopy
|
December 8, 2007
Real-time imaging of surface evolution driven by variable-energy ion irradiation
W Swiech, M Rajappan, M Ondrejcek, et al.
Ultramicroscopy
|
January 3, 2026
Assessing the electric field sensitivity measured by pixelated differential phase contrast imaging in vacuum both in the absence of external fields and under field-bound conditions
Pierpaolo Ranieri, Reinis Ignatans, Victor Boureau, et al.
Ultramicroscopy
|
January 3, 2006
Bioelectromechanical imaging by scanning probe microscopy: Galvani's experiment at the nanoscale
Sergei V Kalinin, B J Rodriguez, J Shin, et al.
Ultramicroscopy
|
January 3, 2006
Diffraction of 0.5keV electrons from free-standing transmission gratings
Ben McMorran, John D Perreault, T A Savas, et al.
Ultramicroscopy
|
February 7, 2006
CBED contrast in the lower order Laue zone
C J Rossouw, C J Maunders, H J Whitfield, et al.
Ultramicroscopy
|
January 18, 2006
On the importance of precise calibration techniques for an atomic force microscope
R J Emerson, T A Camesano
Ultramicroscopy
|
April 1, 1992
3D reconstruction from the Fourier transform of a single superlattice image of an oblique section
K A Taylor, R A Crowther
Page
of 475