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Ultramicroscopy|January 6, 2019
Structure refinement from 'digital' large angle convergent beam electron diffraction patternsA J M Hubert, R Römer, R BeanlandUltramicroscopy|March 13, 2018
STEMcl-A multi-GPU multislice algorithm for simulation of large structure and imaging parameter seriesM Radek, J-G Tenberge, S Hilke, et al.Ultramicroscopy|September 9, 2020
Mapping valence electron distributions with multipole density formalism using 4D-STEMLijun Wu, Qingping Meng, Yimei ZhuUltramicroscopy|September 14, 2020
Atom column detection from simultaneously acquired ABF and ADF STEM imagesJ Fatermans, A J den Dekker, K Müller-Caspary, et al.Ultramicroscopy|September 28, 2020
Lattice contrast in the core-loss EFTEM signal of grapheneMichael J Mohn, Johannes Biskupek, Zhongbo Lee, et al.Ultramicroscopy|December 30, 2019
Sampling optimization of Moiré geometrical phase analysis for strain characterization in scanning transmission electron microscopyA Pofelski, S Ghanad-Tavakoli, D A Thompson, et al.Ultramicroscopy|January 9, 2020
Microscopic investigations of morphology and thermal properties of ZnO thin films grown by atomic layer deposition methodAnna Kaźmierczak-Bałata, Jerzy Bodzenta, Marek GuziewiczUltramicroscopy|September 1, 2020
A hyperspectral unmixing framework for energy-loss near-edge structure analysisSirong Lu, David J SmithUltramicroscopy|October 23, 2020
Orientation mapping of graphene using 4D STEM-in-SEMBenjamin W Caplins, Jason D Holm, Ryan M White, et al.Ultramicroscopy|October 22, 2020
Hidden Markov model for atom-counting from sequential ADF STEM images: Methodology, possibilities and limitationsAnnelies De Wael, Annick De Backer, Sandra Van AertPageof 460