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Ultramicroscopy|January 1, 1986
High spatial resolution analysis using parallel detection eelsM M Disko, H Shuman
Ultramicroscopy|April 15, 2022
Free, flexible and fast: Orientation mapping using the multi-core and GPU-accelerated template matching capabilities in the Python-based open source 4D-STEM analysis toolbox PyxemNiels Cautaerts, Phillip Crout, Håkon W Ånes, et al.
Ultramicroscopy|January 9, 2016
Oxidation-state sensitive imaging of cerium dioxide by atomic-resolution low-angle annular dark field scanning transmission electron microscopyAaron C Johnston-Peck, Jonathan P Winterstein, Alan D Roberts, et al.
Ultramicroscopy|January 1, 2016
Visualization of steps and surface reconstructions in Helium Ion Microscopy with atomic precisionGregor Hlawacek, Maciej Jankowski, Herbert Wormeester, et al.
Ultramicroscopy|January 7, 2016
Scanning thermal microscopy with heat conductive nanowire probesMaria Timofeeva, Alexey Bolshakov, Peter D Tovee, et al.
Ultramicroscopy|December 22, 2015
Measurement of the permittivity and loss of high-loss materials using a Near-Field Scanning Microwave MicroscopeA P Gregory, J F Blackburn, K Lees, et al.
Ultramicroscopy|February 9, 2016
Direct investigation of (sub-) surface preparation artifacts in GaAs based materials by FIB sectioningJürgen Belz, Andreas Beyer, Torsten Torunski, et al.
Ultramicroscopy|February 16, 2016
Ion microscopy based on laser-cooled cesium atomsM Viteau, M Reveillard, L Kime, et al.
Ultramicroscopy|January 19, 2016
Multiscale differential phase contrast analysis with a unitary detectorSergei Lopatin, Yurii P Ivanov, Jurgen Kosel, et al.
Ultramicroscopy|December 9, 2014
Role of the resistivity of insulating field emitters on the energy of field-ionised and field-evaporated atomsL Arnoldi, E P Silaeva, F Vurpillot, et al.
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