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Ultramicroscopy|July 26, 2014
Analytical model of an isolated single-atom electron sourceW J Engelen, E J D Vredenbregt, O J LuitenUltramicroscopy|July 29, 2014
Ptychographic inversion via Wigner distribution deconvolution: noise suppression and probe designPeng Li, Tega B Edo, John M RodenburgUltramicroscopy|August 6, 2014
AFM based dielectric spectroscopy: extended frequency range through excitation of cantilever higher eigenmodesLuis A Miccio, Mohammed M Kummali, Gustavo A Schwartz, et al.Ultramicroscopy|November 5, 2013
Design of an ultra-miniaturized electron optical microcolumn with sub-5 nm very high resolutionTae-Sik Oh, Ho-Seob Kim, Seungjoon Ahn, et al.Ultramicroscopy|December 28, 2013
Determination of localized visibility in off-axis electron holographyRobert A McLeod, Martin Kupsta, Marek MalacUltramicroscopy|December 31, 2013
Writing is magical, mysterious, aggressive, dangerous, not to be trifled withPeter HawkesUltramicroscopy|December 21, 2013
Correlative cryogenic tomography of cells using light and soft x-raysElizabeth A Smith, Bertrand P Cinquin, Myan Do, et al.Ultramicroscopy|April 5, 2016
Measuring the height-to-height correlation function of corrugation in suspended grapheneD A Kirilenko, P N BrunkovUltramicroscopy|April 9, 2016
Data fusion for accurate microscopic rough surface metrologyYuhang ChenUltramicroscopy|April 10, 2016
Polymorphism of amyloid fibrils formed by a peptide from the yeast prion protein Sup35: AFM and Tip-Enhanced Raman Scattering studiesAlexey V Krasnoslobodtsev, Tanja Deckert-Gaudig, Yuliang Zhang, et al.Pageof 460