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Ultramicroscopy
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January 1, 1987
High resolution cryo system designed for JEM 100CX electron microscope
T W Jeng, W Chiu
Ultramicroscopy
|
January 7, 2023
Decomposition of CrN induced by laser-assisted atom probe tomography
Helene Waldl, Marcus Hans, Maximilian Schiester, et al.
Ultramicroscopy
|
January 4, 2023
Correction of AFM data artifacts using a convolutional neural network trained with synthetically generated data
Viktor Kocur, Veronika Hegrová, Marek Patočka, et al.
Ultramicroscopy
|
June 21, 2022
Comparison of detection limits of direct-counting CMOS and CCD cameras in EELS experiments
Mitsutaka Haruta, Jun Kikkawa, Koji Kimoto, et al.
Ultramicroscopy
|
June 11, 2022
Aberration-corrected transmission electron microscopy with Zernike phase plates
Simon Hettler, Raul Arenal
Ultramicroscopy
|
June 11, 2022
Theoretical study on sixth-order geometrical aberration correction
Shigeyuki Morishita, Hidetaka Sawada
Ultramicroscopy
|
June 19, 2022
Three-dimensional stacked filter: A non-linear filter for series images obtained using a transmission electron microscope
Siyuan Huang, Hai Li, Chuanhong Jin, et al.
Ultramicroscopy
|
May 22, 2019
Enhancing phase contrast for bimodal AFM imaging in low quality factor environments
Mehrnoosh Damircheli, Babak Eslami
Ultramicroscopy
|
January 1, 1986
Criteria for the comparison of electron microscopical 3D reconstructions of individual particles
W Hoppe, H Tietz
Ultramicroscopy
|
January 1, 1978
The direct determination of magnetic domain wall profiles by differential phase contrast electron microscopy
J N Chapman, P E Batson, E M Waddell, et al.
Page
of 474
Search research articles
Search
Showing results (11-20 of 4,737) with videos related to
Sort By:
Page
of 474
Ultramicroscopy
|
January 1, 1987
High resolution cryo system designed for JEM 100CX electron microscope
T W Jeng, W Chiu
Ultramicroscopy
|
January 7, 2023
Decomposition of CrN induced by laser-assisted atom probe tomography
Helene Waldl, Marcus Hans, Maximilian Schiester, et al.
Ultramicroscopy
|
January 4, 2023
Correction of AFM data artifacts using a convolutional neural network trained with synthetically generated data
Viktor Kocur, Veronika Hegrová, Marek Patočka, et al.
Ultramicroscopy
|
June 21, 2022
Comparison of detection limits of direct-counting CMOS and CCD cameras in EELS experiments
Mitsutaka Haruta, Jun Kikkawa, Koji Kimoto, et al.
Ultramicroscopy
|
June 11, 2022
Aberration-corrected transmission electron microscopy with Zernike phase plates
Simon Hettler, Raul Arenal
Ultramicroscopy
|
June 11, 2022
Theoretical study on sixth-order geometrical aberration correction
Shigeyuki Morishita, Hidetaka Sawada
Ultramicroscopy
|
June 19, 2022
Three-dimensional stacked filter: A non-linear filter for series images obtained using a transmission electron microscope
Siyuan Huang, Hai Li, Chuanhong Jin, et al.
Ultramicroscopy
|
May 22, 2019
Enhancing phase contrast for bimodal AFM imaging in low quality factor environments
Mehrnoosh Damircheli, Babak Eslami
Ultramicroscopy
|
January 1, 1986
Criteria for the comparison of electron microscopical 3D reconstructions of individual particles
W Hoppe, H Tietz
Ultramicroscopy
|
January 1, 1978
The direct determination of magnetic domain wall profiles by differential phase contrast electron microscopy
J N Chapman, P E Batson, E M Waddell, et al.
Page
of 474