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Ultramicroscopy|January 7, 2023
Decomposition of CrN induced by laser-assisted atom probe tomographyHelene Waldl, Marcus Hans, Maximilian Schiester, et al.
Ultramicroscopy|January 4, 2023
Correction of AFM data artifacts using a convolutional neural network trained with synthetically generated dataViktor Kocur, Veronika Hegrová, Marek Patočka, et al.
Ultramicroscopy|June 21, 2022
Comparison of detection limits of direct-counting CMOS and CCD cameras in EELS experimentsMitsutaka Haruta, Jun Kikkawa, Koji Kimoto, et al.
Ultramicroscopy|June 11, 2022
Aberration-corrected transmission electron microscopy with Zernike phase platesSimon Hettler, Raul Arenal
Ultramicroscopy|June 11, 2022
Theoretical study on sixth-order geometrical aberration correctionShigeyuki Morishita, Hidetaka Sawada
Ultramicroscopy|May 22, 2019
Enhancing phase contrast for bimodal AFM imaging in low quality factor environmentsMehrnoosh Damircheli, Babak Eslami
Ultramicroscopy|January 1, 1978
The direct determination of magnetic domain wall profiles by differential phase contrast electron microscopyJ N Chapman, P E Batson, E M Waddell, et al.
Ultramicroscopy|July 13, 2010
Immobilisation of living bacteria for AFM imaging under physiological conditionsRikke Louise Meyer, Xingfei Zhou, Lone Tang, et al.
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