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Ultramicroscopy|September 5, 2018
Self-consistent atom probe tomography reconstructions utilizing electron microscopyDavid R Diercks, Brian P GormanUltramicroscopy|September 5, 2018
Quantitative analysis of backscattered electron (BSE) contrast using low voltage scanning electron microscopy (LVSEM) and its application to Al0.22Ga0.78N/GaN layersA Garitagoitia Cid, R Rosenkranz, M Löffler, et al.Ultramicroscopy|September 15, 2018
Advanced detector signal acquisition and electron beam scanning for high resolution SEM imagingWilliam C Lenthe, Jean Charles Stinville, McLean P Echlin, et al.Ultramicroscopy|August 13, 2018
Multifrequency Kelvin probe force microscopy on self assembled molecular layers and quantitative assessment of images' qualityDaniel Kopiec, Grzegorz Jóźwiak, Magdalena Moczała, et al.Ultramicroscopy|August 15, 2018
Chirality transitions and transport properties of individual few-walled carbon nanotubes as revealed by in situ TEM probingDai-Ming Tang, Dmitry G Kvashnin, Ovidiu Cretu, et al.Ultramicroscopy|February 13, 2010
Correction of distortion due to thermal drift in scanning probe microscopyBrian S Salmons, Daniel R Katz, Matthew L TrawickUltramicroscopy|September 13, 2016
Combining ptychographical algorithms with the Hybrid Input-Output (HIO) algorithmA P Konijnenberg, W M J Coene, S F Pereira, et al.Ultramicroscopy|September 11, 2016
Three dimensional mapping of Fe dopants in ceria nanocrystals using direct spectroscopic electron tomographyBart Goris, Maria Meledina, Stuart Turner, et al.Ultramicroscopy|September 3, 2016
Two-dimensional Kikuchi patterns of Si as measured using an electrostatic analyserMaarten Vos, Aimo WinkelmannUltramicroscopy|September 2, 2016
Influence of experimental conditions on atom column visibility in energy dispersive X-ray spectroscopyJ H Dycus, W Xu, X Sang, et al.Pageof 460