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Ultramicroscopy|February 13, 2010
Correction of distortion due to thermal drift in scanning probe microscopyBrian S Salmons, Daniel R Katz, Matthew L TrawickUltramicroscopy|September 13, 2016
Combining ptychographical algorithms with the Hybrid Input-Output (HIO) algorithmA P Konijnenberg, W M J Coene, S F Pereira, et al.Ultramicroscopy|September 11, 2016
Three dimensional mapping of Fe dopants in ceria nanocrystals using direct spectroscopic electron tomographyBart Goris, Maria Meledina, Stuart Turner, et al.Ultramicroscopy|September 3, 2016
Two-dimensional Kikuchi patterns of Si as measured using an electrostatic analyserMaarten Vos, Aimo WinkelmannUltramicroscopy|September 2, 2016
Influence of experimental conditions on atom column visibility in energy dispersive X-ray spectroscopyJ H Dycus, W Xu, X Sang, et al.Ultramicroscopy|March 5, 2010
Local crystal structure analysis with several picometer precision using scanning transmission electron microscopyKoji Kimoto, Toru Asaka, Xiuzhen Yu, et al.Ultramicroscopy|May 9, 2017
Detecting dynamic responses of materials and devices under an alternating electric potential by phase-locked transmission electron microscopyKentaro Soma, Stan Konings, Ryotaro Aso, et al.Ultramicroscopy|September 23, 2016
StatSTEM: An efficient approach for accurate and precise model-based quantification of atomic resolution electron microscopy imagesA De Backer, K H W van den Bos, W Van den Broek, et al.Ultramicroscopy|September 26, 2016
Wide-range tunable magnetic lens for tabletop electron microscopeWei-Yu Chang, Fu-Rong ChenUltramicroscopy|June 5, 2017
Preferred diffusion paths for copper electromigration by in situ transmission electron microscopyYoung-Hwa Oh, Sung-Il Kim, Miyoung Kim, et al.Pageof 458