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Ultramicroscopy|June 13, 2008
Characterization of magnetic materials using a scanning microwave microprobeHarutyun Melikyan, Artur Hovsepyan, Tigran Sargsyan, et al.Ultramicroscopy|June 13, 2008
Characterization of Alq3 thin films by a near-field microwave microprobeArtur Hovsepyan, Huneung Lee, Tigran Sargsyan, et al.Ultramicroscopy|June 21, 2008
Measurements of stretch lengths of gold mono-atomic wires covered with 1,6-hexanedithiol in 0.1 M NaClO4 with an electrochemical scanning tunneling microscopeJian Sun, Uichi Akiba, Masamichi FujihiraUltramicroscopy|June 12, 2009
Bandgap measurement of thin dielectric films using monochromated STEM-EELSJucheol Park, Sung Heo, Jae-Gwan Chung, et al.Ultramicroscopy|September 29, 2009
4D ultrafast electron microscopy: imaging of atomic motions, acoustic resonances, and moiré fringe dynamicsHyun Soon Park, J Spencer Baskin, Brett Barwick, et al.Ultramicroscopy|January 10, 2009
APT analyses of deuterium-loaded Fe/V multi-layered filmsR Gemma, T Al-Kassab, R Kirchheim, et al.Ultramicroscopy|January 13, 2009
Atom probe analysis of titanium hydride precipitatesJ Takahashi, K Kawakami, H Otsuka, et al.Ultramicroscopy|October 4, 2011
High-frequency electromagnetic dynamics properties of THP1 cells using scanning microwave microscopyYoo Jin Oh, Hans-Peter Huber, Markus Hochleitner, et al.Ultramicroscopy|August 26, 2011
Effect of sample thickness, energy filtering, and probe coherence on fluctuation electron microscopy experimentsFeng Yi, P M VoylesUltramicroscopy|August 26, 2011
Practical methods for the measurement of spatial coherence--a comparative studyC Maunders, C Dwyer, P C Tiemeijer, et al.Pageof 460