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Ultramicroscopy|September 15, 2012
EEL spectroscopic tomography: towards a new dimension in nanomaterials analysisLluís Yedra, Alberto Eljarrat, Raúl Arenal, et al.Ultramicroscopy|September 15, 2012
Ultra-fast electron diffraction at surfaces: from nanoscale heat transport to driven phase transitionsA Hanisch-Blicharski, A Janzen, B Krenzer, et al.Ultramicroscopy|August 28, 2012
Assessment of lower-voltage TEM performance using 3D Fourier transform of through-focus seriesKoji Kimoto, Keiji Kurashima, Takuro Nagai, et al.Ultramicroscopy|February 18, 2014
A short note on how to convert a conventional analytical TEM into an analytical Low Voltage TEMM Stöger-PollachUltramicroscopy|July 23, 2013
The use of a central beam stop for contrast enhancement in TEM imagingChao Zhang, Qiang Xu, Peter J Peters, et al.Ultramicroscopy|July 23, 2013
Minimizing electrostatic charging of an aperture used to produce in-focus phase contrast in the TEMRobert M Glaeser, Simone Sassolini, Rossana Cambie, et al.Ultramicroscopy|July 12, 2011
Extended ptychography in the transmission electron microscope: possibilities and limitationsF Hüe, J M Rodenburg, A M Maiden, et al.Ultramicroscopy|July 28, 2020
Auto-segmentation technique for SEM images using machine learning: Asphaltene deposition case studyMasakazu Gesho, Wattana Chaisoontornyotin, Omar Elkhatib, et al.Ultramicroscopy|May 11, 2000
International telemicroscopy with a 3 MV ultrahigh voltage electron microscopeA Takaoka, K Yoshida, H Mori, et al.Pageof 460