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Ultramicroscopy|April 20, 2001
Comments on ultra-high-resolution STEMJ M Cowley
Ultramicroscopy|September 22, 2000
Correction of high-resolution data for curvature of the Ewald sphereD J DeRosier
Ultramicroscopy|September 12, 2000
Experimental characterisation of CCD cameras for HREM at 300 kVMeyer, Kirkland, Dunin-Borkowski, et al.
Ultramicroscopy|June 13, 2003
Recent advances in magnetic force microscopyM R Koblischka, U Hartmann
Ultramicroscopy|January 22, 2003
Measurements of the self-sustained enhancement of field emission by carbon fiber microemittersM S Mousa, M J Hagmann, M Brugat, et al.
Ultramicroscopy|January 22, 2003
Stabilization of carbon-fiber cold field-emission cathodes with a dielectric coatingM S Mousa, T F Kelly
Ultramicroscopy|November 12, 2002
Fluctuation microscopy in the STEMP M Voyles, D A Muller
Ultramicroscopy|January 5, 2002
Sub-Angstrom high-resolution transmission electron microscopy at 300 keVM A O'Keefe, C J Hetherington, Y C Wang, et al.
Ultramicroscopy|July 23, 2003
Materials science applications of HREELS in near edge structure analysis and low-energy loss spectroscopyS Lazar, G A Botton, M-Y Wu, et al.
Ultramicroscopy|September 12, 2000
Image deconvolution for protein crystalsS X Yang, F H Li
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