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Ultramicroscopy|December 4, 1998
Cryo X-ray microscopy with high spatial resolution in amplitude and phase contrastG SchneiderUltramicroscopy|October 17, 2017
Scanning distortion correction in STEM imagesShoucong Ning, Takeshi Fujita, Anmin Nie, et al.Ultramicroscopy|June 20, 2026
Characterization of the Timepix4 hybrid pixel detector and its impact on four-dimensional scanning transmission electron microscopy (4D-STEM)Vojtěch Skoumal, Daen Jannis, Erik Kieft, et al.Ultramicroscopy|July 4, 2026
Efficient methods for wave propagation in electron microscopyZdeněk Nekula, Jakub Bělín, Andrea KonečnáUltramicroscopy|June 25, 2026
Deep PACBED: Multitask analysis of PACBED images using deep neural networksDaniel Schneider, Jonas Scheunert, Damien Heimes, et al.Ultramicroscopy|June 5, 2026
STEM in an SEM: Towards high-throughput imaging and analysis of metal nanoclustersYifan Chen, Michael W Fay, Wolfgang Theis, et al.Ultramicroscopy|May 22, 2026
Cross-scale attention network for automated carbon nanomaterial recognition in TEM imagesWenbo Liu, Yanyan Cui, Minghui HeUltramicroscopy|September 29, 2004
APFIM investigations on site occupancies of the ternary alloying elements Cr, Fe, and Re in NiAlG Frommeyer, R Fischer, J Deges, et al.Ultramicroscopy|July 28, 2005
Determination of the Fe content of embedded Cu-rich particles in ferritic alloys using energy-filtered TEMSergio Lozano-Perez, John M Titchmarsh, Michael L JenkinsUltramicroscopy|May 9, 2026
Ω-type jitter-free static magnetic compressor for sub-50-fs 200-keV electron pulsesZhenxia Lv, Lili Li, Yuetian Liu, et al.Pageof 460