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Ultramicroscopy|December 18, 2020
Integrated correction of optical distortions for global HR-EBSD techniquesClément Ernould, Benoît Beausir, Jean-Jacques Fundenberger, et al.
Ultramicroscopy|December 28, 2020
Contrast transfer and noise considerations in focused-probe electron ptychographyColum M O'Leary, Gerardo T Martinez, Emanuela Liberti, et al.
Ultramicroscopy|January 4, 2020
Enhancing the defect contrast in ECCI through angular filtering of BSEsHan Han, Thomas Hantschel, Andreas Schulze, et al.
Ultramicroscopy|December 22, 2019
Ultra-high spatial resolution selected area electron channeling patternsR D Kerns, S Balachandran, A H Hunter, et al.
Ultramicroscopy|March 16, 2020
Source shot noise mitigation in focused ion beam microscopy by time-resolved measurementMinxu Peng, John Murray-Bruce, Karl K Berggren, et al.
Ultramicroscopy|March 3, 2020
Morphological analysis of 3d atom probe data using Minkowski functionalsDaniel R Mason, Andrew J London
Ultramicroscopy|October 9, 2020
Nanowire facilitated transfer of sensitive TEM samples in a FIBSaleh Gorji, Ankush Kashiwar, Lakshmi S Mantha, et al.
Ultramicroscopy|January 1, 1988
A scanning tunneling microscope (STM) for biological applications: design and performanceR Guckenberger, C Kösslinger, R Gatz, et al.
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