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Ultramicroscopy|October 19, 2023
The effect of nanochannel length on in situ loading times of diffusion-propelled nanoparticles in liquid cell electron microscopyPeter Kunnas, Niels de Jonge, Joseph P PattersonUltramicroscopy|October 2, 2023
Haptic sensation-based scanning probe microscopy: Exploring perceived forces for optimal intuition-driven controlM Freeman, R Applestone, W Behn, et al.Ultramicroscopy|December 31, 2002
Backscattered electron imaging and scanning transmission electron microscopy imaging of multi-layersP G Merli, V Morandi, F CorticelliUltramicroscopy|January 22, 2003
Effect of carbon nanotube structural parameters on field emission propertiesY T Feng, S Z Deng, J Chen, et al.Ultramicroscopy|January 22, 2003
Field emission from multiwall carbon nanotubes in controlled ambient gases, H2, CO, N2 and O2Koichi Hata, Akihiro Takakura, Yahachi SaitoUltramicroscopy|January 22, 2003
Field emission from diamond particles studied by scanning field emission microscopyAkihiko Watanabe, Masahiro Deguchi, Makoto Kitabatake, et al.Ultramicroscopy|January 22, 2003
A new step towards the lattice reconstruction in 3DAPF Vurpillot, L Renaud, D BlavetteUltramicroscopy|April 4, 2003
Defining the parameters of a cantilever tip AFM by reference structureV A Bykov, Yu A Novikov, A V Rakov, et al.Ultramicroscopy|April 4, 2003
Computer simulation of Lorentz electron micrographs of thin magnetic particlesThomas Haug, Stephan Otto, Markus Schneider, et al.Ultramicroscopy|March 8, 2003
Lattice-resolution contrast from a focused coherent electron probe. Part IL J Allen, S D Findlay, M P Oxley, et al.Pageof 460