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Ultramicroscopy|July 29, 2006
Enhancement of resolution in core-loss and low-loss spectroscopy in a monochromated microscopeS Lazar, G A Botton, H W ZandbergenUltramicroscopy|August 1, 2006
Mapping chemical and bonding information using multivariate analysis of electron energy-loss spectrum imagesM Bosman, M Watanabe, D T L Alexander, et al.Ultramicroscopy|August 9, 2006
Observations of Si field evaporationKeith Thompson, Jason Sebastian, Stephan GerstlUltramicroscopy|August 29, 2006
Experimental and theoretical determination of low electron energy loss spectra of Ag and RuC Hébert, W-D Schöne, D S SuUltramicroscopy|September 5, 2006
Optimizing phase contrast in transmission electron microscopy with an electrostatic (Boersch) phase plateE Majorovits, B Barton, K Schultheiss, et al.Ultramicroscopy|April 27, 2005
Charge and charging compensation on oxides and hydroxides in oxygen environmental SEMY Ji, H S Guo, T X Zhong, et al.Ultramicroscopy|April 27, 2005
Nondestructive three-dimensional characterization of grain boundaries by X-ray crystal microscopyWenjun Liu, Gene E Ice, Bennett C Larson, et al.Ultramicroscopy|April 27, 2005
Effect of tip shape on capacitance determination accuracy in scanning capacitance microscopyS LányiUltramicroscopy|April 27, 2005
Shear force microscopy with a nanoscale resolutionJ-P Ndobo-Epoy, E Lesniewska, J-P GuicqueroUltramicroscopy|May 12, 2005
A method of dynamic chromatic aberration correction in low-voltage scanning electron microscopesAnjam KhursheedPageof 460