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Ultramicroscopy|July 15, 2021
Accurate post-mortem alignment for Focused Ion Beam and Scanning Electron Microscopy (FIB-SEM) tomographyH Yuan, B Van de Moortèle, T EpicierUltramicroscopy|December 24, 2017
Spectrum imaging of complex nanostructures using DualEELS: II. Absolute quantification using standardsAlan J Craven, Bianca Sala, Joanna Bobynko, et al.Ultramicroscopy|October 7, 2017
Atomic-scale structure relaxation, chemistry and charge distribution of dislocation cores in SrTiO3Peng Gao, Ryo Ishikawa, Bin Feng, et al.Ultramicroscopy|October 7, 2017
Criteria and considerations for preparing atom-probe tomography specimens of nanomaterials utilizing an encapsulation methodologyZhiyuan Sun, Ori Hazut, Roie Yerushalmi, et al.Ultramicroscopy|October 10, 2017
Practical application of direct electron detectors to EBSD mapping in 2D and 3DK P Mingard, M Stewart, M G Gee, et al.Ultramicroscopy|April 23, 2023
Uncovering polar vortex structures by inversion of multiple scattering with a stacked Bloch wave modelSteven E Zeltmann, Shang-Lin Hsu, Hamish G Brown, et al.Ultramicroscopy|October 1, 1992
Quantitative energy-filtered electron microscopy of biological molecules in iceJ P Langmore, M F SmithUltramicroscopy|September 1, 1992
Scanning tunneling microscopy of an ionic crystal: ferritin coreJ Yang, K Takeyasu, A P Somlyo, et al.Ultramicroscopy|September 1, 1992
A method for observing cross-sectional views of biomembranesK Sakata, Y Tahara, K Morikawa, et al.Ultramicroscopy|November 12, 2003
Dynamical simulations of zone axis electron channelling patterns of cubic silicon carbideAimo Winkelmann, Bernd Schröter, Wolfgang RichterPageof 460