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Ultramicroscopy|December 1, 1976
Influence of detector geometry on image properties of the STEM for thick objectsH Rose, J FertigUltramicroscopy|May 13, 1999
Development of X-ray excitable luminescent probes for scanning X-ray microscopyM M MoronneUltramicroscopy|January 11, 2000
Probability calculus for quantitative HREM. Part II: entropy and likelihood conceptsG MöbusUltramicroscopy|July 15, 2000
Mapping and fuzzy classification of macromolecular images using self-organizing neural networksA Pascual, M Bárcena, J J Merelo, et al.Ultramicroscopy|July 15, 2000
HREM of CoSi2/SiC heterophase interface: facts and artifacts in the interface distance profile measurementsLamy, ThibaultUltramicroscopy|February 24, 2001
Quantification of red blood cells using atomic force microscopyM O'Reilly, L McDonnell, J O'MullaneUltramicroscopy|February 24, 2001
Probing molecular interactions and mechanical properties of microbial cell surfaces by atomic force microscopyY F Dufrêne, Boonaert CJP, H C van der Mei, et al.Ultramicroscopy|February 24, 2001
Imaging tip formation in single-mode optical fibresB A Puygranier, S Montgomery, J Ashe, et al.Ultramicroscopy|February 24, 2001
Scaling-index method as an image processing tool in scanning-probe microscopyF Jamitzky, R W Stark, W Bunk, et al.Ultramicroscopy|February 24, 2001
A sample scanning system with nanometric accuracy for quantitative SPM measurementsG B Picotto, M PisaniPageof 460