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Ultramicroscopy|February 24, 2001
Atomic surface characterisation and modification of the layered compounds Bi2Se3, Bi1.9Sb0.1Se3 and Bi1.6Sb0.4Se3S Antoranz Contera, T Yoshinobu, H Iwasaki, et al.Ultramicroscopy|January 5, 2002
Study of field electron emission spectral characteristics of amorphous carbon-nitride filmJ Chen, S Z Deng, N S XuUltramicroscopy|January 5, 2002
Numerical modelling of mass resolution in a scanning atom probeA Cerezo, D VaumousseUltramicroscopy|January 5, 2002
Simulations of photon-assisted tunneling using the Fokker-Planck equation to model the scattering of electrons within the emitting metal tipM J Hagmann, M S Mousa, M BrugatUltramicroscopy|January 5, 2002
Imaging columns of the light elements carbon, nitrogen and oxygen with sub Angstrom resolutionC Kisielowski, C J Hetherington, Y C Wang, et al.Ultramicroscopy|January 5, 2002
Potential-induced resonant tunneling through a redox metalloprotein investigated by electrochemical scanning probe microscopyP Facci, D Alliata, S CannistraroUltramicroscopy|January 5, 2002
LACBED measurement of the chemical composition of a thin In(x)Ga(1-x)As layer buried in a GaAs matrixD Jacob, Y Androussi, A LefebvreUltramicroscopy|January 5, 2002
Modeling the electron field emission from carbon nanotube filmsV Filip, D Nicolaescu, M Tanemura, et al.Ultramicroscopy|January 5, 2002
Dynamics of surface reactions studied by field emission microscopy and atom-probe mass spectrometryN KruseUltramicroscopy|January 5, 2002
Analysis of fiber probes of scanning near-field optical microscope by field emission microscopyS K Sekatskii, B N Mironov, D A Lapshin, et al.Pageof 460