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Ultramicroscopy|March 31, 2000
Atomic force microscopy imaging of living cells: a preliminary study of the disruptive effect of the cantilever tip on cell morphologyH X You, J M Lau, S Zhang, et al.Ultramicroscopy|April 27, 2000
Initial resolution measurements of an improved magnetic-electrostatic detector objective lens for LVSEMKnell, PliesUltramicroscopy|April 27, 2000
Measurement of lens aberrations by means of image displacements in beam-tilt seriesSteinecker, MaderUltramicroscopy|April 27, 2000
Can high-angle annular dark field scattering be represented by a local operator?RezUltramicroscopy|April 27, 2000
TEM analysis of epitaxial semiconductor layers with high stacking fault densities considering artifacts induced by the cross-section geometryWalter, GerthsenUltramicroscopy|April 3, 2001
Surface X-ray absorption spectroscopy: principles and some examples of applicationsP LagardeUltramicroscopy|April 3, 2001
ELNES investigations of the oxygen K-edge in spinelsF T Docherty, A J Craven, D W McComb, et al.Ultramicroscopy|April 3, 2001
Core-hole effect in the ELNES of alpha-Al2O3: experiment and theoryS Nufer, T Gemming, C Elsässer, et al.Pageof 460