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Ultramicroscopy|January 1, 1986
Effect of elastic bend distortions on electron diffraction data from thin protein microcrystalsD L DorsetUltramicroscopy|March 15, 2011
Simulation-aided design and fabrication of nanoprobes for scanning probe microscopyBernard Haochih Liu, Day-Bin ChangUltramicroscopy|March 15, 2011
Distinguishing crystallographic misorientations of lanthanum zirconate epilayers on nickel substrates by electron backscatter diffractionYuan Ji, Li Wang, Yinqi Zhang, et al.Ultramicroscopy|January 4, 2011
WITHDRAWN: A MVSA approach to mine information from APT dataC M Parish, C Capdevila, M K MillerUltramicroscopy|December 21, 2010
Field emission techniques for studying surface reactions: applying them to NO-H2 interaction with Pd tipsT Visart de Bocarmé, Norbert KruseUltramicroscopy|December 22, 2010
Laser assisted atom probe analysis of thin film on insulating substrateM Kodzuka, T Ohkubo, K HonoUltramicroscopy|February 1, 2011
Fabrication and characterization of APT specimens from high dose heavy ion irradiated materialsM K Miller, Y ZhangUltramicroscopy|February 5, 2011
Anomalous distribution in atom map of solute carbon in steelY Kobayashi, J Takahashi, K KawakamiUltramicroscopy|January 21, 2011
Shaping the lens of the atom probe: fabrication of site specific, oriented specimens and application to grain boundary analysisP Felfer, S P Ringer, J M CairneyUltramicroscopy|January 21, 2011
Methods of quantitative matrix analysis of Zircaloy-2M Thuvander, H-O AndrénPageof 460