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Ultramicroscopy|March 31, 2000
Nanoscale devices fabricated by direct machining of GaAs with an atomic force microscopeVersen, Klehn, Kunze, et al.
Ultramicroscopy|March 31, 2000
Formation of nano-pyramids of layered materials with AFMContera, Yoshinobu, Iwasaki, et al.
Ultramicroscopy|March 31, 2000
Comprehensive surface analysis of hydrophobically functionalized SFM tipsLuginbuhl, Szuchmacher, Garrison, et al.
Ultramicroscopy|March 31, 2000
Optimal sensitivity for molecular recognition MAC-mode AFMSchindler, Badt, Hinterdorfer, et al.
Ultramicroscopy|April 27, 2000
Successive approximations for charged particle motionHoffstaetter
Ultramicroscopy|April 27, 2000
Upper limits for the residual aberrations of a high-resolution aberration-corrected STEMHaider, Uhlemann, Zach
Ultramicroscopy|April 27, 2000
Investigation of thermoelectric silicide thin films by means of analytical transmission electron microscopyHofman, Kleint, Thomas, et al.
Ultramicroscopy|November 9, 2000
Parameters affecting specimen flatness of two-dimensional crystals for electron crystallographyJ Vonck
Ultramicroscopy|January 17, 2002
Thermal enhancement of AFM phase contrast for imaging diblock copolymer thin film morphologyM J Fasolk, A M Mayes, N Magonov
Ultramicroscopy|November 3, 2017
Application of the pattern matching approach for EBSD calibration and orientation mapping, utilising dynamical EBSP simulationsT Friedrich, A Bochmann, J Dinger, et al.
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