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Ultramicroscopy

Showing results (261-270 of 4,742) with videos related to

Pageof 475
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Ultramicroscopy|June 7, 2000
Trace analyses from LACBED patternsMorniroli, Gaillot
Ultramicroscopy|July 15, 2000
Defocus-gradient corrected back-projectionG J Jensen, R D Kornberg
Ultramicroscopy|May 11, 2000
Shear force distance control in near-field optical microscopy: experimental evidence of the frictional probe-sample interactionLapshin, Kobylkin, Letokhov
Ultramicroscopy|May 11, 2000
Impact of column bending in high-resolution transmission electron microscopy on the strain evaluation of GaAs/InAs/GaAs heterostructuresTillmann, Lentzen, Rosenfeld
Ultramicroscopy|March 31, 2000
Piezoresistive sensors for scanning probe microscopyGotszalk, Grabiec, Rangelow
Ultramicroscopy|March 31, 2000
Analysis of failure mechanisms in electrically stressed gold nanowiresDurkan, Welland
Ultramicroscopy|March 31, 2000
AFM characterization of domain structure of ferroelectric TGS crystals on a nanoscaleTolstikhina, Belugina, Shikin
Ultramicroscopy|March 31, 2000
Nanoscale devices fabricated by direct machining of GaAs with an atomic force microscopeVersen, Klehn, Kunze, et al.
Ultramicroscopy|March 31, 2000
Formation of nano-pyramids of layered materials with AFMContera, Yoshinobu, Iwasaki, et al.
Ultramicroscopy|March 31, 2000
Comprehensive surface analysis of hydrophobically functionalized SFM tipsLuginbuhl, Szuchmacher, Garrison, et al.
Pageof 475

Showing results (261-270 of 4,742) with videos related to

Sort By:
Pageof 475
Ultramicroscopy|June 7, 2000
Trace analyses from LACBED patternsMorniroli, Gaillot
Ultramicroscopy|July 15, 2000
Defocus-gradient corrected back-projectionG J Jensen, R D Kornberg
Ultramicroscopy|May 11, 2000
Shear force distance control in near-field optical microscopy: experimental evidence of the frictional probe-sample interactionLapshin, Kobylkin, Letokhov
Ultramicroscopy|May 11, 2000
Impact of column bending in high-resolution transmission electron microscopy on the strain evaluation of GaAs/InAs/GaAs heterostructuresTillmann, Lentzen, Rosenfeld
Ultramicroscopy|March 31, 2000
Piezoresistive sensors for scanning probe microscopyGotszalk, Grabiec, Rangelow
Ultramicroscopy|March 31, 2000
Analysis of failure mechanisms in electrically stressed gold nanowiresDurkan, Welland
Ultramicroscopy|March 31, 2000
AFM characterization of domain structure of ferroelectric TGS crystals on a nanoscaleTolstikhina, Belugina, Shikin
Ultramicroscopy|March 31, 2000
Nanoscale devices fabricated by direct machining of GaAs with an atomic force microscopeVersen, Klehn, Kunze, et al.
Ultramicroscopy|March 31, 2000
Formation of nano-pyramids of layered materials with AFMContera, Yoshinobu, Iwasaki, et al.
Ultramicroscopy|March 31, 2000
Comprehensive surface analysis of hydrophobically functionalized SFM tipsLuginbuhl, Szuchmacher, Garrison, et al.
Pageof 475